发明名称 METHOD OF FORMING HARDMASK PATTERNS
摘要 <p>PURPOSE: A method for forming a hard mask pattern is provided to perform an etching process to form a hard mask pattern after forming a compensating film on the damaged part of a hard mask film, thereby preventing the hard mask film from being asymmetrically etched during an etching process. CONSTITUTION: A hard mask film(105) is formed on an underlying layer(101). A first sub film and a second sub film are stacked on the hard mask film. The second sub film is patterned. The first sub film is eliminated by the pattern second sub film as a mask to form a sub pattern on the hard mask film. The sub pattern and the hard mask film are cleaned.</p>
申请公布号 KR20110051723(A) 申请公布日期 2011.05.18
申请号 KR20090108455 申请日期 2009.11.11
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SOO JIN;SIM, GUEE HWANG;PARK, SUN MI;KIM, JEONG SEON
分类号 H01L21/027;H01L21/308 主分类号 H01L21/027
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