发明名称 |
METHOD OF FORMING HARDMASK PATTERNS |
摘要 |
<p>PURPOSE: A method for forming a hard mask pattern is provided to perform an etching process to form a hard mask pattern after forming a compensating film on the damaged part of a hard mask film, thereby preventing the hard mask film from being asymmetrically etched during an etching process. CONSTITUTION: A hard mask film(105) is formed on an underlying layer(101). A first sub film and a second sub film are stacked on the hard mask film. The second sub film is patterned. The first sub film is eliminated by the pattern second sub film as a mask to form a sub pattern on the hard mask film. The sub pattern and the hard mask film are cleaned.</p> |
申请公布号 |
KR20110051723(A) |
申请公布日期 |
2011.05.18 |
申请号 |
KR20090108455 |
申请日期 |
2009.11.11 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, SOO JIN;SIM, GUEE HWANG;PARK, SUN MI;KIM, JEONG SEON |
分类号 |
H01L21/027;H01L21/308 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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