PURPOSE: A test method for a memory reliability stress is provided to generate similar data to real environment by using valuation data. CONSTITUTION: a test method for a memory reliability stress is comprised of steps: obtaining the address of a memory(S10); obtaining a rotate bit number from a rotate table(S20); rotating the memory address; generating valuation data(S30); reading/ writing valuation data from/in a memory address(S40); and increasing the memory address(S50).
