发明名称 EXAMINATION APPARATUS FOR CIRCUIT BOARD
摘要 PURPOSE: An examination apparatus for a circuit board is provided to improve a productivity by placing a transport unit adjacent to an extraction unit. CONSTITUTION: A circuit board examination apparatus comprises a transport unit(110), an extraction unit(120), and a separate unit. The transport unit is formed in one side of an examination apparatus frame. An inspecting unit inspects one or more circuit boards which are transferred from a magazine on the transport unit. The extraction unit extracts the circuit board which is extracted from the inspection unit.
申请公布号 KR20110050975(A) 申请公布日期 2011.05.17
申请号 KR20090107603 申请日期 2009.11.09
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 HEO, JUN YEON
分类号 H05K13/08;H05K13/02 主分类号 H05K13/08
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