发明名称 Phase change memory device with bit line discharge path
摘要 A phase change memory device includes a cell array. The cell array includes a phase change resistance cell formed at an intersection of a word line and a bit line and a dummy cell configured to discharge the bit line in response to a bit line discharge signal in a precharge mode. A column switching unit is configured to selectively control a connection between the bit line and a global bit line in response to a column selecting signal.
申请公布号 US7944739(B2) 申请公布日期 2011.05.17
申请号 US20080146539 申请日期 2008.06.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG HEE BOK;HONG SUK KYOUNG
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
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