发明名称 |
SYSTEM OF 2D CODE DETECTION AND THICKNESS MEASUREMENT FOR GLASS SUBSTRATE, AND METHOD OF THE SAME |
摘要 |
PURPOSE: A system and a method for 2D code detection and thickness measurement of a glass substrate are provided to enable free measurement of the entire glass substrate by a contactless method for measuring the thickness of a glass substrate. CONSTITUTION: A system for 2D code detection and thickness measurement of a glass substrate comprises a loading/unloading unit(100), a washing unit(200), a measuring unit(300), and a mounting unit(40), and a measuring terminal(400). The loading/unloading unit loads and unloads a glass substrate(20). The washing unit washes the glass substrate. The measuring unit detects 2D code of the glass substrate and measures the thickness thereof. The mounting unit is rotated b y a central rotary shaft(30). The measuring terminal automatically controls the operation of the mounting unit. The measuring terminal calculates the thickness of the glass substrates and detects the 2D code.
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申请公布号 |
KR101033855(B1) |
申请公布日期 |
2011.05.16 |
申请号 |
KR20100085897 |
申请日期 |
2010.09.02 |
申请人 |
NOVATECH CO., LTD.;2ISPECTRA |
发明人 |
KIM, TEA JIN;KIM, HYUN SEOK;LEE, SANG JOO;HWANG, YONG WOON |
分类号 |
G01B11/06;G06T7/60 |
主分类号 |
G01B11/06 |
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