发明名称 SYSTEM OF 2D CODE DETECTION AND THICKNESS MEASUREMENT FOR GLASS SUBSTRATE, AND METHOD OF THE SAME
摘要 PURPOSE: A system and a method for 2D code detection and thickness measurement of a glass substrate are provided to enable free measurement of the entire glass substrate by a contactless method for measuring the thickness of a glass substrate. CONSTITUTION: A system for 2D code detection and thickness measurement of a glass substrate comprises a loading/unloading unit(100), a washing unit(200), a measuring unit(300), and a mounting unit(40), and a measuring terminal(400). The loading/unloading unit loads and unloads a glass substrate(20). The washing unit washes the glass substrate. The measuring unit detects 2D code of the glass substrate and measures the thickness thereof. The mounting unit is rotated b y a central rotary shaft(30). The measuring terminal automatically controls the operation of the mounting unit. The measuring terminal calculates the thickness of the glass substrates and detects the 2D code.
申请公布号 KR101033855(B1) 申请公布日期 2011.05.16
申请号 KR20100085897 申请日期 2010.09.02
申请人 NOVATECH CO., LTD.;2ISPECTRA 发明人 KIM, TEA JIN;KIM, HYUN SEOK;LEE, SANG JOO;HWANG, YONG WOON
分类号 G01B11/06;G06T7/60 主分类号 G01B11/06
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