| 摘要 |
The device has a mirror type test pattern (5) integrated with a guiding element (3) of a sliding door, where the guiding element slides in a guiding rail (2). The test pattern is cooperated with a piezoelectric type wave transceiver e.g. diode (6), by interfering with propagation of waves for determining a position of the sliding door at a given instant. An additional tube (4) houses the test pattern in a passage for connecting the test pattern with the guiding element, where the tube acts as a waveguide for the waves emitted by the transceiver. |
