发明名称 Interface Adapter For Connecting With A Test Probe
摘要 A interface adapter comprising a connecting board having the first ports and the second ports, the first ports being electrically connected with the second ports; a pin header having the first pins and the second pins, the first pins passing through the first ports, the second pins being connected with the second ports; a female header having openings for receiving the first pins, the connecting board being located between the pin header and the female header. The second pin is designed to O-shape or U-shape for providing enough position to connecting the test probe, preventing from disengagement of the chip from the test card.
申请公布号 US2011109340(A1) 申请公布日期 2011.05.12
申请号 US20100787852 申请日期 2010.05.26
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 XIONG BEAR;CUI SUPER
分类号 G01R31/02 主分类号 G01R31/02
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