| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit test device capable of testing at a higher speed than change of a range through software by controlling the change of the range through hardware. SOLUTION: The circuit test device is provided, which includes a range determination part 22 for acquiring a voltage value to be tested and determining a range value according to the acquired voltage value, and a range setting part 23 for changing own circuit configuration to make the range value of voltage to be applied to a circuit to be tested from a currently set range value to the range value determined by the range determination part 22. COPYRIGHT: (C)2011,JPO&INPIT
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