发明名称 EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT, SEMICONDUCTOR ELEMENT, AND METHOD FOR PRODUCING EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT
摘要 Disclosed is an epitaxial substrate which uses a silicon substrate as a base substrate and is capable of providing an HEMT element that has high withstand voltage. Specifically disclosed is an epitaxial substrate which is obtained by forming a group of group III nitride layers on a (111) single crystal Si substrate such that the (0001) crystal plane is generally parallel to the substrate surface. The epitaxial substrate is provided with: a first group III nitride layer that is a layer containing multiple defects, said layer being formed from AlN and configured of columnar or granular crystals and/or domains; a second group III nitride layer that has a three dimensionally recessed and projected surface at the interface with the first group III nitride layer; and a third group III nitride layer that is epitaxially grown on the second group III nitride layer and is formed as a composition gradient layer in which the presence ratio of Al decreases toward a fourth group III nitride.
申请公布号 WO2011055774(A1) 申请公布日期 2011.05.12
申请号 WO2010JP69663 申请日期 2010.11.05
申请人 NGK INSULATORS, LTD.;MIYOSHI MAKOTO;SUMIYA SHIGEAKI;ICHIMURA MIKIYA;TANAKA MITSUHIRO 发明人 MIYOSHI MAKOTO;SUMIYA SHIGEAKI;ICHIMURA MIKIYA;TANAKA MITSUHIRO
分类号 H01L29/201;C23C16/02;C23C16/34;C30B29/38;H01L21/205;H01L21/338;H01L29/47;H01L29/778;H01L29/812;H01L29/872 主分类号 H01L29/201
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