发明名称 |
EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT, SEMICONDUCTOR ELEMENT, AND METHOD FOR PRODUCING EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT |
摘要 |
Disclosed is an epitaxial substrate which uses a silicon substrate as a base substrate and is capable of providing an HEMT element that has high withstand voltage. Specifically disclosed is an epitaxial substrate which is obtained by forming a group of group III nitride layers on a (111) single crystal Si substrate such that the (0001) crystal plane is generally parallel to the substrate surface. The epitaxial substrate is provided with: a first group III nitride layer that is a layer containing multiple defects, said layer being formed from AlN and configured of columnar or granular crystals and/or domains; a second group III nitride layer that has a three dimensionally recessed and projected surface at the interface with the first group III nitride layer; and a third group III nitride layer that is epitaxially grown on the second group III nitride layer and is formed as a composition gradient layer in which the presence ratio of Al decreases toward a fourth group III nitride. |
申请公布号 |
WO2011055774(A1) |
申请公布日期 |
2011.05.12 |
申请号 |
WO2010JP69663 |
申请日期 |
2010.11.05 |
申请人 |
NGK INSULATORS, LTD.;MIYOSHI MAKOTO;SUMIYA SHIGEAKI;ICHIMURA MIKIYA;TANAKA MITSUHIRO |
发明人 |
MIYOSHI MAKOTO;SUMIYA SHIGEAKI;ICHIMURA MIKIYA;TANAKA MITSUHIRO |
分类号 |
H01L29/201;C23C16/02;C23C16/34;C30B29/38;H01L21/205;H01L21/338;H01L29/47;H01L29/778;H01L29/812;H01L29/872 |
主分类号 |
H01L29/201 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|