发明名称 APPARATUS FOR INSPECTING SUBSTRATE
摘要 PURPOSE: An apparatus for inspecting a substrate is provided to prevent a substrate from drooping without interrupting the movement of a robot arm, thereby accurately inspecting the substrate. CONSTITUTION: A plurality of stage units(210) is separated so that a robot arm can pass among the stage units. The stage units comprise a jetting hole for jetting air onto a substrate. A plurality of sub stages(220) is installed among a plurality of stage units. The sub stages comprise a jetting hole for jetting air onto the substrate. A vision camera scans the substrate while the vision camera moves together with the substrate. A sub stage of a driving unit is far from the robot arm so that the sub stage does not interrupt the robot arm.
申请公布号 KR20110049210(A) 申请公布日期 2011.05.12
申请号 KR20090106124 申请日期 2009.11.04
申请人 LIGADP CO., LTD. 发明人 HONG, SOK YONG
分类号 H01L21/66;G01N21/88;H01L21/67 主分类号 H01L21/66
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