发明名称 HYBRID DOUBLE BOX BACK GATE SILICON-ON-INSULATOR WAFERS WITH ENHANCED MOBILITY CHANNELS
摘要 A semiconductor wafer structure for integrated circuit devices includes a bulk substrate; a lower insulating layer formed on the bulk substrate; an electrically conductive back gate layer formed on the lower insulating layer; an upper insulating layer formed on the back gate layer; and a hybrid semiconductor-on-insulator layer formed on the upper insulating layer, the hybrid semiconductor-on-insulator layer comprising a first portion having a first crystal orientation and a second portion having a second crystal orientation.
申请公布号 US2011108943(A1) 申请公布日期 2011.05.12
申请号 US20090613574 申请日期 2009.11.06
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DENNARD ROBERT H.;OUYANG QIQING C.;YAU JENG-BANG
分类号 H01L29/06;H01L21/762 主分类号 H01L29/06
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