发明名称 GATE STRUCTURE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A gate structure and method of manufacturing the same are provided to implement an excellent erase saturation property by laminating a silicon oxide and high dielectric layer which has a thickness of less than 10Å. CONSTITUTION: In a gate structure and a method of manufacturing the same, a tunnel insulating film pattern(112) is formed on a substrate(100). A charge trapping layer pattern(122) is formed on the tunnel insulating film. A first silicon oxide film pattern having a thickness of less than 10Åis formed on the charge trapping film pattern. A first high dielectric pattern is formed on the first silicon oxide pattern. A second silicon oxide pattern is formed on the first high dielectric pattern.</p>
申请公布号 KR20110048614(A) 申请公布日期 2011.05.12
申请号 KR20090105257 申请日期 2009.11.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOO, DONG CHUL;KIM, BYONG JU;CHOI, HAN MEI;HWANG, KI HYUN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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