GATE STRUCTURE AND METHOD OF MANUFACTURING THE SAME
摘要
<p>PURPOSE: A gate structure and method of manufacturing the same are provided to implement an excellent erase saturation property by laminating a silicon oxide and high dielectric layer which has a thickness of less than 10Å. CONSTITUTION: In a gate structure and a method of manufacturing the same, a tunnel insulating film pattern(112) is formed on a substrate(100). A charge trapping layer pattern(122) is formed on the tunnel insulating film. A first silicon oxide film pattern having a thickness of less than 10Åis formed on the charge trapping film pattern. A first high dielectric pattern is formed on the first silicon oxide pattern. A second silicon oxide pattern is formed on the first high dielectric pattern.</p>
申请公布号
KR20110048614(A)
申请公布日期
2011.05.12
申请号
KR20090105257
申请日期
2009.11.03
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
YOO, DONG CHUL;KIM, BYONG JU;CHOI, HAN MEI;HWANG, KI HYUN