发明名称 |
FORMATION OF INTER-DEVICE STI REGIONS AND INTRA-DEVICE STI REGIONS USING DIFFERENT DIELECTRIC MATERIALS |
摘要 |
PROBLEM TO BE SOLVED: To form inter-device STI (Shallow Trench Isolation) regions and intra-device STI regions using different dielectric materials. SOLUTION: An integrated circuit structure includes a substrate having a first portion in a first device region and a second portion in a second device region; and two insulation regions in the first device region and over the substrate. The two insulation regions include a first dielectric material having a first k value. A semiconductor strip is between and adjoining the two insulation regions, with a top portion of the semiconductor strip, for forming a semiconductor fin, over top surfaces of the two insulation regions. An additional insulation region is in the second device region and over the substrate. The additional insulation region includes a second dielectric material having a second k value greater than the first k value. COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011097058(A) |
申请公布日期 |
2011.05.12 |
申请号 |
JP20100240536 |
申请日期 |
2010.10.27 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD |
发明人 |
YUAN FENG;LEE TSUNG-LIN;CHEN HUNG-MING;CHANG CHANG-YUN |
分类号 |
H01L29/78;H01L21/76;H01L21/8234;H01L27/08;H01L27/088;H01L29/786 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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