发明名称 APPARATUS AND METHOD FOR INSPECTING SURFACE DEFECT ON BOTH SIDES OF OPTICAL MAGNETIC DISK
摘要 PROBLEM TO BE SOLVED: To inspect a surface defect of a magnetic disk using continuous recording system, as well as a surface defect of a magnetic disk using discrete track recording system and patterned media recording system, with only one inspection apparatus. SOLUTION: An inspection apparatus compares a signal with a threshold for inspecting a magnetic medium using continuous recording system to detect a surface defect of a continuous recording type magnetic disk, and on the other hand discriminates a data area from a servo area on the basis of a level of the signal obtained by detecting light reflected from the disk surface and performs threshold processing on the signals from each of the areas, to detect a defect of the magnetic disk using discrete track recording or patterned media recording. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011096305(A) 申请公布日期 2011.05.12
申请号 JP20090247552 申请日期 2009.10.28
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KATO YOJI;ISHIWATA OSAMU;TAMURA SHINTARO;OINUMA YOSHIYUKI
分类号 G11B5/84;G01N21/95 主分类号 G11B5/84
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