| 摘要 |
Fixtures according to the present invention include fixing surfaces in the same shape as end surfaces of a device under test which is to be measured while an electromagnetic wave to be measured at a frequency equal to more than 0.01 [THz] and equal to or less than 100 [THz] is irradiated on the device under test. The end surfaces are fixed to the fixing surfaces. When a refractive index of the fixtures is n0, and a refractive index of the device under test is n1, a relationship n1−0.1≦̸n0≦̸n1+0.1 holds. The fixtures do not cover a side surface of the device under test. The fixtures are rotated about a straight line orthogonal to the fixing surfaces as a rotational axis. |
