发明名称 Process of patterning small scale devices
摘要 A process is provided that includes forming a first mask on an underlying layer, where the mask has two adjacent portions with an open gap therebetween, and depositing a second mask material within the open gap and at an inclined angle with respect to an upper surface of the underlying layer to form a second mask. In another implementation, a process is provided that includes forming a first mask on an underlying layer, where the mask has a pattern that includes an open gap, and depositing a second mask material within the open gap to form a second mask, where particles of the second mask material are directed in parallel or substantially in parallel to a line at an inclined angle with respect to an upper surface of the underlying layer.
申请公布号 US7939247(B2) 申请公布日期 2011.05.10
申请号 US20080201993 申请日期 2008.08.29
申请人 GLOBALFOUNDRIES INC. 发明人 CHEN AN;KRIVOKAPIC ZORAN
分类号 G03F7/00;G03F1/00 主分类号 G03F7/00
代理机构 代理人
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