发明名称 Method of forming a low resistance semiconductor contact and structure therefor
摘要 In one embodiment, silicide layers are formed on two oppositely doped adjacent semiconductor regions. A conductor material is formed electrically contacting both of the two silicides.
申请公布号 US7939897(B2) 申请公布日期 2011.05.10
申请号 US20100766601 申请日期 2010.04.23
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC 发明人 GRIVNA GORDON M.;VENKATRAMAN PRASAD
分类号 H01L21/02 主分类号 H01L21/02
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