发明名称 Non-destructive examination apparatus and method for guided waves
摘要 A method of performing a non-destructive examination of a piece of material, having the steps of providing an angle beam wedge and at least two transducers placed upon the wedge, wherein the transducers are placed in a phased array, placing the wedge upon the piece of material to be examined, producing a guided wave into the piece of material to be examined, wherein the guided wave is placed into the material through a synthetically changed incident angle, receiving the guided wave from the piece of material, and determining one of a presence of defects and lack of defects in the piece of material from the received guided wave. Transducers used may include 360 degree guided wave, radial polarized units, parallel shear units for shear horizontal activation and guided wave wheel probes.
申请公布号 US7938008(B2) 申请公布日期 2011.05.10
申请号 US20070946281 申请日期 2007.11.28
申请人 FBS, INC. 发明人 OWENS STEVEN E.;ROSE JOSEPH L.;ROYER, JR. ROGER L.
分类号 G01N29/00 主分类号 G01N29/00
代理机构 代理人
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