发明名称 Method of calibrating a test chart and a scanning device
摘要 A method of calibrating a test chart is provided. First, a reference scanning device scans a reference test chart to obtain a plurality of reference optical density (OD) values. The reference test chart includes a plurality of reference blocks. Then, the reference scanning device scans a test chart to obtain a plurality of first OD values. The test chart includes a plurality of blocks, which corresponds to the reference blocks. Next, a compensation function derived from respectively converting the first OD values into the reference OD values is obtained.
申请公布号 US7940430(B2) 申请公布日期 2011.05.10
申请号 US20070882440 申请日期 2007.08.01
申请人 AVISION INC. 发明人 HSIEH MING-HSIEN;HSU SHENG PENG;YANG CHIN PING
分类号 H04N1/04 主分类号 H04N1/04
代理机构 代理人
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