发明名称 SEMICONDUCTOR MEMORY DEVICE FOR SELECTIVELY USING PADS
摘要 PURPOSE: A semiconductor memory device for selectively using pads is provided to perform a parallel test using the address pin of a tester connected to an address pad by using an address pad as an input out pad. CONSTITUTION: In a semiconductor memory device for selectively using pads, an address buffer(110) selectively receives the signal of an address pad. A data input buffer unit(120) selectively the signal of the address pad. A signal control unit(105) controls the signal path of the address pad. The signal control unit controls the address pad to be transmitted to the address buffer. The signal control unit controls the signal of the address pad to be the data input buffer unit.
申请公布号 KR101033490(B1) 申请公布日期 2011.05.09
申请号 KR20090117243 申请日期 2009.11.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, DAE SUK;KANG, SEOUNG HYUN
分类号 G11C7/10;G11C8/08 主分类号 G11C7/10
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