发明名称 |
METHOD OF FORMING COPPER LAYER ON SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide an electroplating method capable of keeping a sufficient quantity of production processing for printing. SOLUTION: The method of forming a copper layer on a wafer includes: a step of filling a via opening with copper using one or more low-powered positive-pulse cycles or AC cycles in a plating chamber, the via opening having a radius less than 1.0 micrometer and being filled to eliminate a gap; and a step of improving the throughput of the wafer by the plating chamber by using high-powered DC cycles in the plating chamber and completing the copper layer on the wafer. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011091425(A) |
申请公布日期 |
2011.05.06 |
申请号 |
JP20100281418 |
申请日期 |
2010.12.17 |
申请人 |
FREESCALE SEMICONDUCTOR INC |
发明人 |
CINDY REIDSEMA SIMPSON;MIKKOLA ROBERT DOUGLAS;HERRICK MATTHEW T;BAKER BRETT CAROLINE;PENA DAVID MORALEZ;ACOUSTA EDWARD;CHOWDHURY RINA;AZRAK MARIJEAN;GOLDBERG CINDY KAY;ISLAM MOHAMMED RABIUL |
分类号 |
C25D5/18;H01L21/3205;C25D7/12;H01L21/28;H01L21/288;H01L21/768;H01L23/52 |
主分类号 |
C25D5/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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