发明名称
摘要 <p>A radiation-sensitive composition including a compound (P) having a partial structure (A) having an ionic structural site and capable of decomposing upon irradiation with an actinic ray or radiation to generate an acid and a partial structure (B) having at least one phenolic hydroxyl group, a part or all of hydrogen atoms of the hydroxyl group or groups each being protected by a group capable of leaving by the action of an acid, wherein the ionic structural site of the partial structure (A) contained in the compound (P) is a structure capable of generating an acid anion in the compound (P) upon irradiation with an actinic ray or radiation; a pattern-forming method using the same; and a resin which is used in the composition.</p>
申请公布号 KR20110047220(A) 申请公布日期 2011.05.06
申请号 KR20117005230 申请日期 2009.08.26
申请人 发明人
分类号 G03F7/039;C08F212/14;C08F220/10;H01L21/027 主分类号 G03F7/039
代理机构 代理人
主权项
地址