发明名称 Fabrication of Through Silicon Via using Hybrid process
摘要 PURPOSE: Through Silicon Via technology processing method using a hybrid process is provided to form an excellent penetration electrode by eliminating residues on the surface of a semiconductor substrate. CONSTITUTION: Through Silicon Via technology processing method using a hybrid process is as follows. A photosensitive resin layer(30) is formed on a semiconductor substrate(10). Penetration electrodes(3) are formed on the semiconductor substrate, in which the photosensitive resin layer is formed, using an ultrashort pulse laser. The laser The penetration electrodes, formed by the ultrashort pulse laser, are cleaned using a deep reactive ion etching method.
申请公布号 KR20110046953(A) 申请公布日期 2011.05.06
申请号 KR20090103681 申请日期 2009.10.29
申请人 发明人
分类号 B23K26/382;H05K3/42 主分类号 B23K26/382
代理机构 代理人
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