发明名称 METHOD OF MANUFACTURING EPITAXIAL SILICON WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing an epitaxial silicon wafer, wherein a mirror plane-polishing process is simplified, productivity is increased to achieve cost reduction, and surface roughness of an epitaxial film is suppressed. SOLUTION: The epitaxial film is vapor-phase grown on a surface of a mirror plane silicon wafer before finish mirror plane polishing. Then a surface of the epitaxial film is etched with an HCl gas, so the mirror plane-polishing process is simplified, the productivity is improved to reduce the cost, and the surface roughness of the epitaxial film is suppressed. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011091387(A) 申请公布日期 2011.05.06
申请号 JP20100212644 申请日期 2010.09.22
申请人 SUMCO CORP 发明人 KANEHARA HIDEAKI;WADA NAOYUKI;OUCHI SATOHIRO;OGATA SHINICHI;NISHIMURA HIRONORI
分类号 H01L21/205;H01L21/20 主分类号 H01L21/205
代理机构 代理人
主权项
地址