发明名称 INSPECTION METHOD AND INSPECTION SYSTEM FOR CIRCUIT BOARD
摘要 PROBLEM TO BE SOLVED: To rationally determine whether a circuit board is non-defective by detecting a latent defect of a conductive pattern of the circuit board. SOLUTION: An inspection method includes a first inspection step in which the circuit board to be inspected is held at first test temperature and electric characteristics of the circuit board are measured to rank the circuit board as at least good, no good, or unknown based upon a measurement result; and a second inspection step in which change of electric characteristics of a circuit board ranked as unknown in the first inspection is measured for a predetermined time while the circuit board is held at second test temperature, and the circuit board is ranked as good or no good based upon a measurement result. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011091162(A) 申请公布日期 2011.05.06
申请号 JP20090242696 申请日期 2009.10.21
申请人 AI TECHNOLOGY CO LTD 发明人 YAMAMOTO MASAHIRO
分类号 H05K3/00;G01R31/02 主分类号 H05K3/00
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