摘要 |
PROBLEM TO BE SOLVED: To rationally determine whether a circuit board is non-defective by detecting a latent defect of a conductive pattern of the circuit board. SOLUTION: An inspection method includes a first inspection step in which the circuit board to be inspected is held at first test temperature and electric characteristics of the circuit board are measured to rank the circuit board as at least good, no good, or unknown based upon a measurement result; and a second inspection step in which change of electric characteristics of a circuit board ranked as unknown in the first inspection is measured for a predetermined time while the circuit board is held at second test temperature, and the circuit board is ranked as good or no good based upon a measurement result. COPYRIGHT: (C)2011,JPO&INPIT
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