| 摘要 |
PURPOSE: A test handler and a part feeding method thereof are provided to stably and rapidly execute the test of a semiconductor device. CONSTITUTION: An unloading buffer(430,440) settle electronic components in which s test is completed by an unloading sorting unit(410,420). An unloading unit(500) comprises a plurality of user trays(50) in which a sorted electronic component is loaded from an unloading buffer. An unloading picking unit is installed in the unloading unit. An electronic component settled in the unloading buffer of the unloading sorting unit(400) is classified according to a grade and is settled in a user tray. |
