发明名称 INSPECTION DEVICE AND METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an inspection device for improving processing performance per unit time and reducing cost. <P>SOLUTION: The inspection device 10 inspects a characteristic of solar cell modules 7 when pseudo sunlight is received on a light receiving surface. The device 10 includes a light source 1 radiating the pseudo sunlight and an arrangement stand 2 for arranging the plurality of sunlight cell modules 7 in an irradiation region to which the pseudo sunlight is radiated so that the modules incline against the pseudo sunlight made incident on the light receiving surface while the light receiving surface receives the pseudo sunlight. Thus, the processing performance per unit time can be improved and the cost can be reduced. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011091089(A) 申请公布日期 2011.05.06
申请号 JP20090241337 申请日期 2009.10.20
申请人 SHARP CORP 发明人 AKAMINE AKIHITO
分类号 H01L31/04 主分类号 H01L31/04
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