发明名称 SYSTEM FOR TESTING ELECTRONIC DEVICES
摘要 A system for testing an electronic device comprises a first output, a second output, and a third output connected to a positive input, an identification input, and a negative input of the electronic device, respectively. The system further comprises a switch comprising at least two dynamic contacts, each of which is connected to a resistor for the use of identification.
申请公布号 US2011101993(A1) 申请公布日期 2011.05.05
申请号 US20100764974 申请日期 2010.04.22
申请人 CHI MEI COMMUNICATION SYSTEMS, INC. 发明人 LAI CHUN-CHIN;RAU JIANN-CHYI
分类号 H01H31/02 主分类号 H01H31/02
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