| 摘要 |
Electrical properties of concealed dielectric objects, such as the dielectric permittivity, can be deduced from incident, reflected, and transmitted electromagnetic waves in an imaging system. In a confocal arrangement a horn illuminates a reflect array and the reflect array is configured to focus the radiation at an element in the scan volume. The reflections are in turn refocused by a reflect array at the horn aperture. The reflect array is electronically configured to scan the focal point throughout the scan volume in a systematic way. Knowledge of the horn pattern and the scan strategy allows the system to compute the geometry associated with each volume element. Amplitude and phase variations between the object and the surrounding volume and the computed geometry are used to estimate the relative permittivity and thus facilitate categorization of the object using a database of material relative permittivities.
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