| 摘要 |
A test system for testing an electronic device is disclosed. The test system includes a signal generator for generating an input signal, a signal splitter for splitting the input signal into a first splitting signal and a second splitting signal, a micro control unit for generating a first control signal and a second control signal, a first transmission interface for transmitting the first splitting signal and the first control signal, a second transmission interface for transmitting the second splitting signal and the second control signal, and a first signal adjustment unit for transforming the first splitting signal to a first test signal for test according to the first control signal.
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