A METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL IN A BATCH MANUFACTURING LAYOUT
摘要
<p>Presented is a system for thin film photovoltaic panel quality control in a batch manufacturing process. The system includes a panel illuminating unit, a detector unit, a robotic mechanism handling the panel and providing a relative displacement between the panel and the panel illuminating unit and illumination detector unit. A control unit is operative to coordinate the quality control process with movements of at least the robotic mechanism, process at least one detected illumination thin film interaction product and derive at least one thin film parameter.</p>
申请公布号
WO2011024170(A4)
申请公布日期
2011.05.05
申请号
WO2010IL00698
申请日期
2010.08.26
申请人
BRIGHTVIEW SYSTEMS LTD.;ASPIR, DORON;SHOHAM, BENJAMIN;SCHEINER, DAVID