发明名称 LINE WIDTH ROUGHNESS IMPROVEMENT WITH NOBLE GAS PLASMA
摘要 A method for forming a photoresist mask may comprise providing a ultra-violet (UV) producing gas to a vacuum chamber having a substrate, ionizing the UV producing gas to produce UV rays to irradiate the substrate, and etching features into the substrate through the photoresist mask.
申请公布号 US2011104616(A1) 申请公布日期 2011.05.05
申请号 US20090921753 申请日期 2009.02.18
申请人 LAM RESEARCH CORPORATION 发明人 CHENG SHIH-YUAN;LIU SHENJIAN;HONG YOUN GI;FU QIAN
分类号 G03F7/20;C23F1/08 主分类号 G03F7/20
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