发明名称 Extraction of Component Models from PCB Channel Scattering Parameter Data by Stochastic Optimization
摘要 Various embodiments herein include one or more of systems, methods, software, and/or data structures to extract models of components (e.g., vias and traces) for PCB channels from measurements (or simulations) taken from physical PCB channels. By applying stochastic optimization to measurements of two PCB channels having different channel lengths, s-matrices (e.g., two-port, four-port, and the like) of the components of a PCB channel may be accurately determined by searching the multi-dimensional parameter space for parameters that comply with the measured values. Once the models for the components have been accurately determined, they may be utilized in constructing a model library that includes component models and is based on physical measurement data.
申请公布号 US2011107292(A1) 申请公布日期 2011.05.05
申请号 US20090608364 申请日期 2009.10.29
申请人 SUN MICROSYSTEMS, INC. 发明人 LEE JUYOUNG;DOBLAR DREW G.
分类号 G06F17/50 主分类号 G06F17/50
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