发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR PERFORMING DATA COMPRESSION TEST OF THE SAME
摘要 A semiconductor memory device includes a plurality of data transmission lines, a plurality of parallel-to-serial conversion sections configured to receive, serially align, and output data from at least two of the plurality of data transmission lines, a plurality of data compression circuits configured to receive, compress, and output outputs of at least two of the plurality of parallel-to-serial conversion sections, and a plurality of data output circuits configured to output respective compression results of the plurality of data compression circuits to an outside of a chip.
申请公布号 US2011103164(A1) 申请公布日期 2011.05.05
申请号 US20090647196 申请日期 2009.12.24
申请人 YUN JAE-WOONG;LEE JONG-CHERN;BYUN HEE-JIN 发明人 YUN JAE-WOONG;LEE JONG-CHERN;BYUN HEE-JIN
分类号 G11C29/00;G11C7/00 主分类号 G11C29/00
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