| 摘要 |
PURPOSE: A semiconductor memory device and a compress test method of the same are provided to output one representative data pad by compressing all data stored in a memory bank. CONSTITUTION: In a semiconductor memory device and a compress test method of the same, a data compression unit(410) compresses a plurality of data The data is saved in a first memory bank and a second memory bank. The data compression unit outputs the first and second compression signals. An additional data compression unit(420) compresses the first and second compression signals to output them. A data compression unit outputs the first and second compression signal as an output data. An output data unit(430) outputs the compression data to a representative data pad. |
