| 摘要 |
An optical arrangement for oblique plane microscopy includes a first optical subassembly having an objective lens that receives light from a sample in use, and configured to produce an intermediate image of the sample, and a second optical subassembly focused on the intermediate image. Optical axes of the first and second subassemblies are at an angle to each other at the point of the intermediate image, such that the second subassembly images an oblique plane in the intermediate image, corresponding to an oblique plane in the sample. An oblique plane microscopy method is performed by directing an incident light beam through the objective lens to illuminate or excite the oblique plane in the sample, and receiving light from the sample through the same objective lens. The incident light beam is incident on the sample at an angle of substantially 90° relative to the light beam received from the sample. |
