| 摘要 |
Provided is a particle characterization instrument that can ensure measurement accuracy even though light detecting means has a single configuration, and enables the number of optical elements to be decreased as much as possible to suppress cost increase and reduce the number of adjustment places, and the particle characterization instrument has an incident side polarizer 24 and an incident side 1/4 wavelength plate 25 as an illumination optical system mechanism 2 and, as a light receiving optical system mechanism 3, an exit side 1/4 wavelength plate 33 and an exit side polarizer 34 that can be rotated to a plurality of angle positions around a cell 4, wherein light attenuating means 23 that prevents a polarization state from being changed is provided on a light path, and a light attenuation rate by the light attenuating means 23 is controlled such that a detected light intensity at each measurement position falls within a measurement range of light detecting means 31. |
