发明名称 |
Microscopic method and microscope with improved resolution |
摘要 |
The method involves producing an illuminating pattern of a sample in a position. Relative shifting perpendicular to an illumination direction is produced between detection and the illuminating pattern with step size below resolution limit of a microscope from the position into another position of the illuminating pattern. Detection signals are detected and stored in the two positions. A high-resolution image is produced by offsetting the stored detection signals, where the pattern consists of point-shaped or linear scanning of the sample and generation of a point pattern or line pattern. An independent claim is also included for a microscope consisting of an illumination light. |
申请公布号 |
EP2317362(A1) |
申请公布日期 |
2011.05.04 |
申请号 |
EP20100013882 |
申请日期 |
2010.10.22 |
申请人 |
CARL ZEISS MICROIMAGING GMBH |
发明人 |
KLEPPE, INGO;NETZ, RALF;NOVIKAU, YAUHENI |
分类号 |
G02B21/00 |
主分类号 |
G02B21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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