发明名称 Integrated semiconductor substrate structure and method of manufacturing an integrated semiconductor substrate structure
摘要 The integrated semiconductor substrate structure comprises a substrate (1), a GaN-heterostructure (20) and a semiconductor substrate layer (30). The GaN heterostructure (20) is present in a first device area (51) for definition of GaN-based devices, which heterostructure (20) is covered at least partially with a protection layer (8). The semiconductor substrate layer (30) is present in a second device area (52) for definition of CMOS devices. At least one of the GaN heterostructure (20) and the semiconductor substrate layer (30) is provided in at least one trench (14) in the substrate (1), so that the GaN heterostructure (20) and the semiconductor substrate layer (30) are laterally juxtaposed.
申请公布号 EP2317554(A1) 申请公布日期 2011.05.04
申请号 EP20090174721 申请日期 2009.10.30
申请人 IMEC 发明人 DEGROOTE, STEFAN;CHENG, KAI
分类号 H01L27/06;H01L21/8252;H01L21/8258 主分类号 H01L27/06
代理机构 代理人
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