发明名称 Ion beam irradiating apparatus, and method of producing semiconductor device
摘要 An ion beam irradiating apparatus has a field emission electron source 10 which is disposed in a vicinity of a path of the ion beam 2, and which emits electrons 12. The field emission electron source 10 is placed in a direction along which an incident angle formed by the electrons 12 emitted from the electron source 10 and a direction parallel to the traveling direction of the ion beam 2 is in the range from −15 deg. to +45 deg. (an inward direction of the ion beam 2 is +, and an outward direction is −).
申请公布号 US7935944(B2) 申请公布日期 2011.05.03
申请号 US20070304241 申请日期 2007.06.12
申请人 KYOTO UNIVERSITY;NISSIN ION EQUIPMENT CO., LTD. 发明人 ISHIKAWA JUNZO;NICOLAESCU DAN;GOTOH YASUHITO;SAKAI SHIGEKI
分类号 G21G1/10 主分类号 G21G1/10
代理机构 代理人
主权项
地址