发明名称 Forming low dielectric constant dielectric materials
摘要 In some embodiments, a damascene structure may be formed with metal lines separated by a dielectric layer. Portions of the dielectric layer may be ion implanted with carbon and/or inert species to lower selectively the dielectric constant, while leaving the bulk of the dielectric layer unaffected by the implant. As a result, suitably low dielectric constants can be achieved in damascene dielectric layers with sufficient mechanical strength.
申请公布号 US7935627(B1) 申请公布日期 2011.05.03
申请号 US20090398298 申请日期 2009.03.05
申请人 SHOR YAKOV;ALTSHULER SEMEON;SHUMILIN VALERY;RIPP ALEXANDER 发明人 SHOR YAKOV;ALTSHULER SEMEON;SHUMILIN VALERY;RIPP ALEXANDER
分类号 H01L21/4763;H01L23/48 主分类号 H01L21/4763
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