发明名称 |
Method of forming TEM sample holder |
摘要 |
A TEM sample holder is formed from at least one nano-manipulator probe tip and a TEM sample holder pre-form. The probe tip is permanently attached to the TEM sample-holder pre-form to create a TEM sample holder before attachment of a sample to the point of the probe tip inside a FIB. In the preferred embodiment the probe tip is attached to the TEM sample holder pre-form by applying pressure to the pre-form and the probe tip, so as to cause plastic flow of the pre-form material about the probe tip. The TEM sample holder may have smaller dimensions than the TEM sample holder pre-form; in this case the TEM sample holder is cut from the larger TEM sample holder pre-form, preferably in the same operation as attaching the probe tip.
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申请公布号 |
US7935937(B2) |
申请公布日期 |
2011.05.03 |
申请号 |
US20090391552 |
申请日期 |
2009.02.24 |
申请人 |
OMNIPROBE, IN.C |
发明人 |
MOORE THOMAS M.;AMADOR GONZALO;ZAYKOVA-FELDMAN LYUDMILA |
分类号 |
G01N23/00;B01F;G01F23/00;H01J37/20 |
主分类号 |
G01N23/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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