发明名称 Conductive film structure, fabrication method thereof, and conductive film type probe device for IC
摘要 A method for forming a conductive film structure is provided, which includes providing a flexible insulating substrate, forming a conductive film overlying the flexible insulating substrate, patterning the conductive film to form a plurality of micro-wires overlying the flexible insulating substrate, wherein the micro-wires are extended substantially parallel to each other, forming an insulating layer overlying the flexible insulating substrate and the micro-wires, and winding or folding the flexible insulating substrate along an axis substantially parallel to an extending direction of the micro-wires to form a conducting lump.
申请公布号 US7934314(B2) 申请公布日期 2011.05.03
申请号 US20080323422 申请日期 2008.11.25
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 CHOU MIN-CHIEH;WU TUNG-CHUAN;TSAI JEN-HUI;LIN HUNG-YI
分类号 H05K3/02 主分类号 H05K3/02
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