发明名称 Apparatus and method for thermal processing of substrate
摘要 A thermal processing apparatus (1) comprises a chamber body (6), a holding part (7) for holding a substrate (9) inside the chamber body (6), a light emitting part (5) for heating the substrate (9) through light irradiation and a light measuring part (2) for measuring light energy. The light measuring part (2) comprises a calorimeter (24) disposed outside the chamber body (6), a light guide structure (20) for guiding the light inside the chamber body (6) to the calorimeter (24) and a calculation part (25) for performing computations on the basis of an output of the calorimeter (24). In the thermal processing apparatus (1), by measuring the light from the light emitting part (5) by the calorimeter (24), it is possible to measure the energy of light emitted from the light emitting part (5) during thermal processing inside chamber body (6) and obtain a surface temperature of the substrate (9) by the calculation part (25).
申请公布号 US7935913(B2) 申请公布日期 2011.05.03
申请号 US20040940095 申请日期 2004.09.14
申请人 DAINIPPON SCREEN MFG. CO., LTD. 发明人 KUSUDA TATSUFUMI
分类号 C23C16/46;H05B1/02;G01J5/08;G01J5/10;H01L21/00;H01L21/26;H01L21/31 主分类号 C23C16/46
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