发明名称 Method of Manufacturing the Semiconductor Device
摘要 A method of manufacturing semiconductor device includes preparing a substrate having a first surface and a second surface opposite to the first surface. A first insulation layer is formed on the second surface. A sacrificial layer is formed on the first insulation layer. An opening is formed to penetrate through the substrate and extend from the first surface to a portion of the sacrificial layer. A second insulation layer is formed on an inner wall of the opening. A plug is formed to fill the opening. The sacrificial layer is removed to expose a lower portion of the plug through the second surface.
申请公布号 US2011097891(A1) 申请公布日期 2011.04.28
申请号 US20100906578 申请日期 2010.10.18
申请人 发明人 LEE KYU-HA;YOON MIN-SEUNG;LEE UI-HYOUNG;CHOI JU-IL;KIM NAM-SEOG;MA KEUM-HEE
分类号 H01L21/44 主分类号 H01L21/44
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