WAVE ABERRATION MEASURING METHOD AND WAVE ABERRATION MEASURING DEVICE

摘要

Disclosed is a wave aberration measuring method in which wave aberration is measured with improved measuring accuracy by applying light emitted from a light source onto a lens to be tested and by detecting light transmitted through the lens to be tested. The method comprises a step of measuring wave aberration while the diaphragm of the lens to be tested is open; a step of measuring the central position of the pupil of the lens to be tested while the diaphragm of the lens to be tested is closed; and a step of expanding the wave aberration to a polynomial using the central position of the pupil as an origin. Also disclosed is a wave aberration measuring device.