发明名称 TEST DEVICE AND TEST METHOD
摘要 PROBLEM TO BE SOLVED: To perform a quick and accurate degradation test using real data with respect to a service to be provided on a daily basis or the huge patch of an OS. SOLUTION: This test method in a test device is configured to create test data information from request input history information and access history information to the system, and to update the test data information so that the request input time of the second test data can be delayed by a prescribed time when the access time of first test data as update access and second test data as update access are overlapped, and to input test data included in the updated test data information to a system for a test. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011086083(A) 申请公布日期 2011.04.28
申请号 JP20090237844 申请日期 2009.10.15
申请人 HITACHI LTD 发明人 KATAOKA SHOKEI;NAKATANI TAKESHI;YOSHIDA TAKAHIRO;KOGA NOBUTO
分类号 G06F11/28 主分类号 G06F11/28
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