发明名称 METHOD OF FORMING AN ARRAY OF HIGH ASPECT RATIO SEMICONDUCTOR NANOSTRUCTURES
摘要 A new method for forming an array of high aspect ratio semiconductor nanostructures entails positioning a surface of a stamp comprising a solid electrolyte in opposition to a conductive film disposed on a semiconductor substrate. The surface of the stamp includes a pattern of relief features in contact with the conductive film so as to define a film- stamp interface. A flux of metal ions is generated across the film-stamp interface, and a pattern of recessed features complementary to the pattern of relief features is created in the conductive film. The recessed features extend through an entire thickness of the conductive film to expose the underlying semiconductor substrate and define a conductive pattern on the substrate. The stamp is removed, and material immediately below the conductive pattern is selectively removed from the substrate. Features are formed in the semiconductor substrate having a length-to-width aspect ratio of at least about 5: 1.
申请公布号 WO2011049804(A2) 申请公布日期 2011.04.28
申请号 WO2010US52581 申请日期 2010.10.14
申请人 THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS;LI, XIULING;FANG, NICHOLAS, X.;FERREIRA, PLACID, M.;CHERN, WINSTON;CHUN, IK, SU;HSU, KENG, HAO 发明人 LI, XIULING;FANG, NICHOLAS, X.;FERREIRA, PLACID, M.;CHERN, WINSTON;CHUN, IK, SU;HSU, KENG, HAO
分类号 B32B1/00 主分类号 B32B1/00
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