发明名称 |
SEMICONDUCTOR DEVICE INCLUDING METAL SILICIDE LAYER AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device including a metal silicide layer and a method for manufacturing the semiconductor device. <P>SOLUTION: Disclosed is the device formed from the method of fabricating a fine metal silicide layer having a uniform thickness regardless of substrate doping. A planar vacancy is created by the separation of an amorphousized surface layer of a silicon substrate from an insulating layer. A metal source enters the vacancy via a contact hole through the insulating layer connecting with the vacancy, and a heat treatment converts the metal in the vacancy into metal silicide. The separation is induced by converting the amorphous silicon into crystalline silicon. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2011086934(A) |
申请公布日期 |
2011.04.28 |
申请号 |
JP20100224839 |
申请日期 |
2010.10.04 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
JUNG JONG-KI |
分类号 |
H01L21/28;H01L21/3205;H01L23/52 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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