发明名称 SEMICONDUCTOR DEVICE INCLUDING METAL SILICIDE LAYER AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device including a metal silicide layer and a method for manufacturing the semiconductor device. <P>SOLUTION: Disclosed is the device formed from the method of fabricating a fine metal silicide layer having a uniform thickness regardless of substrate doping. A planar vacancy is created by the separation of an amorphousized surface layer of a silicon substrate from an insulating layer. A metal source enters the vacancy via a contact hole through the insulating layer connecting with the vacancy, and a heat treatment converts the metal in the vacancy into metal silicide. The separation is induced by converting the amorphous silicon into crystalline silicon. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011086934(A) 申请公布日期 2011.04.28
申请号 JP20100224839 申请日期 2010.10.04
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 JUNG JONG-KI
分类号 H01L21/28;H01L21/3205;H01L23/52 主分类号 H01L21/28
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