发明名称 ELECTRICAL CONNECTING APPARATUS AND TESTING SYSTEM USING THE SAME
摘要 An embodiment of an electrical connecting apparatus includes a chip unit having a plurality of electronic components arranged on the upper side of a chip supporting body, a probe unit having a plurality of contacts arranged on the lower side of a probe supporting body, and a connecting unit arranged between the chip unit and the probe unit and having a connecting member supporting body and a plurality of connecting members electrically connecting the chip unit to the probe unit. The chip unit, the probe unit and the connecting unit are vacuum-coupled.
申请公布号 US2011095779(A1) 申请公布日期 2011.04.28
申请号 US20100907878 申请日期 2010.10.19
申请人 KABUSHIKI KAISHA NIHON MICRONICS 发明人 WASHIO KENICHI;HASEGAWA MASASHI
分类号 G01R31/00;H01R12/70 主分类号 G01R31/00
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